Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST)... Register or sign in below to ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Memory-efficient, multithreaded engines utilize available server cores to speed up automatic test pattern generation (ATPG) and silicon diagnosis Twenty-five percent fewer test patterns reduce test ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...