Semiconductor Engineering

Chip Complexity Drives Innovation In Automated Test Equipment

Innovations in semiconductor technology—such as advancements in AI high-performance computing (HPC), Angstrom-scale silicon process nodes, silicon photonics, and automotive xEV wideband gap power ...
Seeking Alpha

Teradyne Announces the ETS-800 Dual Sector Automated Test System

NORTH READING, Mass--(BUSINESS WIRE)-- Teradyne, Inc. (TER) (NASDAQ: TER), a leading provider of automated test equipment and advanced robotics, is proud to announce the launch of the ETS-800 D20, the ...
Electronic Design

ATE Switching Subsystems: 3 Methods for Successful Implementation

Switching subsystems are a critical part of automated test equipment. Learn how to build one for optimal performance, even at the earliest stages of product design. What to consider for a successful ...
EDN

SDRs for Automated Testing

Software-defined radio (SDR) is revolutionizing the way wireless devices are designed and tested. When compared with traditional radio approaches, SDRs offer a high degree of flexibility and ...
EDN

System-level test’s expanding role in producing complex chips

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
AZOM

A Closer Look at Semiconductor Test Equipment

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...
Semiconductor Engineering

Semiconductor Test Faces Technology Shifts In The AI Era

The surge in data-rich applications shows no signs of slowing down, fueling significant evolution within the global semiconductor industry. This insatiable demand for data necessitates a comprehensive ...