Memory-efficient, multithreaded engines utilize available server cores to speed up automatic test pattern generation (ATPG) and silicon diagnosis Twenty-five percent fewer test patterns reduce test ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on ICs continues to double every 18 to 24 ...

Mountain View, CA. Synopsys Inc. on Tuesday announced its next-generation ATPG and diagnostics solution, TetraMAX II, incorporating the innovative test engines unveiled at the International Test ...

Large digital integrated circuits are becoming harder to test in a time- and cost-efficient manner. AI chips, in particular, have tiled architectures that are putting pressure on older testing ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...