Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Dimension XR scanning probe microscope ...

NanoWorld today officially introduced its new Hybrid-Nitride AFM probe for contact-mode. The Hybrid-Nitride™ probe combines silicon nitride cantilevers and tips with unique features like single holder ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

There are several different types of scanning probe microscopes, the most prominent of which are atomic force microscopy (AFM) and scanning tunneling microscopy (STM). There are also many other types, ...

(Nanowerk Spotlight) Photothermal induced resonance (PTIR) has found application in the characterization of materials in fields spanning from photovoltaics, plasmonic, polymer science, biology and ...

For a long time, researchers contested the presence of microscopic pathogens suspected of causing various diseases in plants and animals. The invention of the electron microscope in 1933 made them ...

A team of researchers has developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes they call 3DTIPs. AFM technology allows scientists to observe, measure, and ...

A team of researchers from NYU Abu Dhabi's Advanced Microfluidics and Microdevices Laboratory (AMMLab) have developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes ...