The majority of semiconductor devices are made up of heterostructures, which are stacked layers of distinctive materials deposited by utilizing distinctive methods. These layers have a thickness in ...

The NANOscientific Symposium Series (NSS) 2025 has successfully concluded its global program, bringing together the ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Through a novel combination of machine learning and atomic force microscopy, researchers in China have unveiled the molecular ...

Quantum Design (QD) announces the culmination of almost a decade of research into the area of correlative microscopy. The FusionScope is an innovative correlative microscope that combines the power of ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

What is Atomic Force Microscopy? Atomic force microscopy has been an effective and essential method utilized extensively for nanotechnology, physics, and biological applications. It is a surface ...

A new technical paper titled “Probing the Nanoscale Onset of Plasticity in Electroplated Copper for Hybrid Bonding Structures via Multimodal Atomic Force Microscopy” was published by researchers at ...

Recognition of the crucial role that nanomechanical properties play in the structure and function of biological systems is growing steadily. Atomic force microscopy (AFM), a high-resolution surface ...