The atomic force microscope (AFM), together with the scanning tunneling microscope (STM), was invented in 1986 by Binnig, Quate, and Gerber. Similar to other scanning probe microscopes, the AFM uses a ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

The following sections cover the basic concepts and technologies that underpin the construction and operation of an atomic force microscope. An atomic force microscope is optimized for measuring ...

Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...

This article serves as a basic introduction to the design and operation of an atomic force microscope. The following sections cover the basic concepts and technologies that help understand the ...

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announced today that its next-generation Atomic Force Microscope (AFM), Vero, has received three prestigious awards. Vero AFM ...

An interview with Prof. Manfred Radmacher, Universität Bremen conducted by April Cashin-Garbutt, MA (Cantab). Can you please give a brief history of the use of AFM to study cell mechanics in order to ...

Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...

Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...

German scientists have built a high resolution microscope out of Lego parts and components salvaged from a mobile phone, according to a recent paper published in The Biophysicist. They found that ...

Atomic force microscopy, or AFM, is a widely used technique that can quantitatively map material surfaces in three dimensions, but its accuracy is limited by the size of the microscope’s probe. A new ...