Huge transistor counts, rising on-chip clock rates, the relentlessly escalating levels of integration in systems-on-chip, and the new types of defects seen in deep-submicron and nanometer processes ...
The V500 DFT-focused engineering test system includes new features and options for a wider range of applications. It includes optional support for delay (ac) scan to 30 MHz; I DDQ test methodologies; ...
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